TS 51.017 – SIM Conformance Test Specification
3GPP TS 51.017 is the 3GPP Technical Specification for SIM Conformance Test Specification. It is part of 3GPP Rel-4 (version 4.2.0).
Defines conformance tests, equipment, procedures, and requirements for 2G SIM cards and their ME interface.
Releases and versions of TS 51.017
| Release | Latest version | Links |
|---|---|---|
| Rel-4 | 4.2.0 | Read · Download (3GPP) |
Scope of TS 51.017
Category: Testing (SIM Conformance Testing). Technology generation: 2G. Network layer: Testing.
Who should read this specification?
- Device manufacturers
- Network operators
- Regulators and standards bodies
- Researchers and academics
Implementation notes
Complexity level: Advanced. Implementation difficulty: High.
Key technologies
Other specifications in the 51 series
Frequently asked questions
What is 3GPP TS 51.017?
3GPP TS 51.017 is the 3GPP Technical Specification for SIM Conformance Test Specification. Defines conformance tests, equipment, procedures, and requirements for 2G SIM cards and their ME interface.
Which 3GPP releases include TS 51.017?
TS 51.017 is part of 3GPP Rel-4. The latest version on 3GPP Explorer is 4.2.0 (Rel-4).
What category does TS 51.017 belong to?
TS 51.017 belongs to the Testing (SIM Conformance Testing) category of 3GPP specifications. It applies to 2G networks.
Now in 3GPP
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